TESTING OF DIGITAL SYSTEMS

As the complexity of modern digital systems increases, so does the need for ever more rigorous testing at all levels, from individual chips up to complete system architectures. This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing. It covers every key topic, including fault simulation, CMOS testing, design for testability, and built-in self test. Aimed at graduate students of electrical and computer engineering, the book is also the most up-to-date reference on the market for practicing engineers.